PALO ALTO, Calif.–Agilent Technologies Inc. today rolled out a desktop version of its flash-memory and logic tester line. The Versatest Model V4000 is a complete, single platform that is geared for ...

San Jose, CA – April 16, 2001 – Logic Vision, Inc., an IP provider of embedded test solutions, and Advantest, an automatic test equipment supplier and producer of electronic and optoelectronic ...

Two test strategies are used to test virtually all IC logic—automatic test pattern generation (ATPG) with test pattern compression, and logic built-in self-test (BIST). For many years, there was a ...

As the tests progress the logic levels on each pin are displayed using colours. A detailed description of the software operation is given later. The unit may also be suitable for use with other types ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.